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Rapid-Rate Temperature (& Humidity)Cycle Chamber Series
Compact Rapid Temperature Change(humidity) Chamber-GMS Series
Bench-Top Type Temperature (& Humidity) Chamber
Temperature (& Humidity) Chamber Series
Low Humidity Type Temperature Humidity Chamber Series
Temperature (& Humidity) Chamber(Wide view)Series
Temperature (& Humidity) Chamber(for Battery test)
High Performance Temperature (Humidity) Chamber
Thermal Shock Chamber -GTSD series
Compact Ultra low Temperature Chamber-GMC
Automobile manufacturers need to consider their products from several points of view. Many of the installed components such as In-vehicle sensors, Secondary battery, LED, CCD, Power devices, Car navigation system, ECU, Semiconductor, PCB etc. will be evaluated several times by using our environmental test chambers to pass rigorous environmental changes.
| Markets | Detection Object | Application | Technology | Solution |
|
Automobile
|
Automotive Electronic Devices(ECU) | Inspection | Low/high-temperature testing | Temperature (& Humidity) Chamber |
| Evaluation | Low/high-temperature testing | Oven:Temperature Chamber | ||
| Dew cycle test | Rapid-Rate Temperature (& Humidity)Cycle Chamber | |||
| Characteristic Test | Rapid-Rate Temperature (& Humidity)Cycle Chamber | |||
| On-Board Battery | Inspection | On-board Battery | Temperature (& Humidity) Chamber | |
| Evaluation | Characteristic Test | Rapid-Rate Temperature (& Humidity)Cycle Chamber | ||
| Driving Safety Device | Inspection | PCB Aging Testing | Temperature (& Humidity) Chamber | |
| Oven:Temperature Chamber | ||||
| Evaluation | Characteristic Test | Rapid-Rate Temperature (& Humidity)Cycle Chamber | ||
| Occupants Safety Device(Air Bag) | Inspection | Passenger Protection Device (Airbag) | Rapid-Rate Temperature (& Humidity)Cycle Chamber | |
| On-Board Navigation System | Inspection | Finished products screening | Temperature (& Humidity) Chamber | |
| Rapid-Rate Temperature (& Humidity)Cycle Chamber | ||||
| ETC Operation System | Inspection | Low/high-temperature testing | Temperature (& Humidity) Chamber | |
| Oven:Temperature Chamber | ||||
| Evaluation | Characteristic Test | Rapid-Rate Temperature (& Humidity)Cycle Chamber | ||
| Other Relevant Components(Semiconductor) | High-temperature testing | Oven:Temperature Chamber |